| Analysis,fabrication,and measurement of Y aperture element frequency selective surface |
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| 作者姓名： | 李小秋 周建民 高劲松 |
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| 作者单位： | Changchun Institute of Optics Fine Mechanics and Physics Chinese Academy of Sciences，Changchun 130033 Graduate School of the Chinese Academy of Sciences，Beijing 100039，East China Jiaotong University Nanchang 330013，Changchun Institute of Optics Fine Mechanics and Physics，Chinese Academy of Sciences，Changchun 130033 |
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| 基金项目： | This work was supported by the CAS Innovation Program. |
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| 摘 要： | The analysis of Y aperture element frequency selective surface (FSS) using the spectral domain method and the moment method is presented.With the vacuum depositing and photolithography,the corresponding Y aperture element FSS was produced,and it was tested in the microwave darkroom.The calculated and measured results are in good agreement.
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