Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon |
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| Authors: | O. V. Bogdanov K. B. Korotchenko Yu. L. Pivovarov |
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| Affiliation: | (1) Tomsk Polytechnic University, Tomsk, 634050, Russia |
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| Abstract: | It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation. |
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