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A new algorithm for reliability evaluation of three-state device complex networks: Minimal cut-minimal path method
Authors:Li Dong-KuiChi Hang-Zhong
Abstract:In this paper, we have modified W. J. Ruger's method W. J. Rueger, Microelectron Reliab. 27, 273–277 (1987)], given a new algorithm to compute the two-terminal reliability of three-state device complex networks. It is a fast, simple method by hand and easily used by computers.
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