Yield oscillations of inelastic processes under channeling conditions at angles greater than the critical angle

A quantum-mechanical analysis of the angular dependence of the yield of inelastic processes in thin crystals under planar-channeling conditions reveals strong intensity oscillations at a given depth for incidence angles ψ > ψ_c. The dependence of the period of these oscillations on the distance z from the surface of incidence is investigated, and pronounced oscillations of the yield versus z are shown to occur simultaneously at fixed ψ.