光学探测系统电磁屏蔽设计与应用

光学探测系统在高功率微波系统运行造成的强辐射、强电磁干扰环境下工作，HPM产生的强电磁脉冲会通过后门耦合的方式由探测器前端光学镜头进入内部的电路系统造成光学探测系统瞬间黑屏、图像抖动、器件毁坏等现象，通过采用光学玻璃金属丝夹层的方法研制光窗，在2.4 GHz±100 MHz频段内电磁屏蔽性能达到了65 dB，同时满足探测目标的光窗透过率的要求。经过应用后表明:加载了这种电磁屏蔽光窗的光学探测系统在HPM工作时图像稳定，未受到干扰。

Design and application of electromagnetic shielding of optical detection system

IR optical detector system can work at strong radiation and electromagnetic interference caused by the operation of high power microwave(HPM) system. The strong electromagnetic pulse generated by HPM will enter the inner circuit system through the front-end optical lens of the detector with the back-door coupling, resulting in the phenomenon of instant black screen, image jitter, electronic device destruction and so on. The optical window was developed by using embedding metal lines into optical materials. These metal lines were made to be a net and to be implanted in the middle of optical glass. The performance of electrical shielding was up to 65 dB in 2.4 GHz±100 MHz frequency band. It can meet the requirement of the optical window transmittance of the detection target. The application shows that the image of the optical detection system loaded with the electromagnetic shielding optical window is stable and undisturbed when the HPM is working.