Improved evaluation of electronic speckle pattern interferograms by photogrammetric image analysis |
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Authors: | Dieter Dirksen, Jan Gettkant, Guido Bischoff, Bj rn Kemper, Zolt n B r cz,Gert von Bally |
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Affiliation: | aDepartment of Prosthodontics, University of Münster, Waldeyerstrasse 30, D-48129 Münster, Germany;bLaboratory of Biophysics, University of Münster, Robert-Koch-Str. 45, D-48129 Münster, Germany |
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Abstract: | Electronic speckle pattern interferometry (ESPI) is a well-established tool for non-destructive testing. It allows the quantitative determination of surface deformations and micro-movements with a sub-micrometer resolution. In the case of objects which are extended in depth, however, the evaluation and interpretation of the resulting correlation fringe patterns can be affected by perspective image distortions as well as by a varying image size. In this paper a method for combination of ESPI with a photogrammetric 3D coordinate measurement is presented. In this way, interferogram data are precisely allocated in 3D-space. Furthermore, it is possible to take into account a spatially varying sensitivity vector. The utilizability of the method is demonstrated by a deformation measurement on a stone sculpture. |
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Keywords: | Electronic speckle pattern interferometry (ESPI) Photogrammetry Sensitivity vector |
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