A noncontact atomic force microscope in air using a quartz resonator and the FM detection method

Noncontact imaging was successfully performed with the quartz resonator in air by using the FM detection method. A constant frequency shift mode was used. The frequency shift was about -30 mHz, which was induced by the attractive force gradient. A noncontact image of the Si(111) atomic step was obtained with vertical and lateral resolutions of 0.8 Å and 60 Å.