Insitu Plane—View and Cross—Scctional Transmission Electron Microscopy of Fractal Formation in Au/a—Ge Bilayer Films |
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引用本文: | 张庶元,潘登余,等.Insitu Plane—View and Cross—Scctional Transmission Electron Microscopy of Fractal Formation in Au/a—Ge Bilayer Films[J].中国物理快报,2002,19(6):828-831. |
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作者姓名: | 张庶元 潘登余 |
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作者单位: | StructureResearchLaboratory,UniversityofScienceandTechnologyofChina,Hefei230026 |
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摘 要: | Fractal crystallization in Au/a-Ge bilayer films has been studied by in situ plane-view and cross-sectional transmission electron microscopy.The experimental evidence suggests that the fractal crystallizaqtion is controlled by both diffusion and reaction processes.The growth kinetics analysis indicates that both diffusion-limited aggregation and random successive nucleation mechanisms play an important role in fractal crystallization in Au/a-Ge bilayer films.
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关 键 词: | 薄膜 Au/a-Ga双层薄膜 电子显微图象 |
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