| Insitu Plane—View and Cross—Scctional Transmission Electron Microscopy of Fractal Formation in Au／a—Ge Bilayer Films |
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| 引用本文： | 张庶元,潘登余,等.Insitu Plane—View and Cross—Scctional Transmission Electron Microscopy of Fractal Formation in Au／a—Ge Bilayer Films[J].中国物理快报,2002,19(6):828-831. |
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| 作者姓名： | 张庶元 潘登余 |
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| 作者单位： | StructureResearchLaboratory,UniversityofScienceandTechnologyofChina,Hefei230026 |
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| 摘 要： | Fractal crystallization in Au/a-Ge bilayer films has been studied by in situ plane-view and cross-sectional transmission electron microscopy.The experimental evidence suggests that the fractal crystallizaqtion is controlled by both diffusion and reaction processes.The growth kinetics analysis indicates that both diffusion-limited aggregation and random successive nucleation mechanisms play an important role in fractal crystallization in Au/a-Ge bilayer films.
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| 关 键 词： | 薄膜 Au／a－Ga双层薄膜 电子显微图象 |
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