X-Ray Topographic Investigation of Dendritic Silicon Crystals

Using Lang and double-crystal X-ray topographic methods the dislocation structure of dendritic silicon crystals have been investigated. It is shown that the surface layers of these crystals have a more perfect structure than their bulk volume. The twin lamella is a dislocation-free formation and there are dislocation-free zones ∼ 1,5 mm in width in the volume of crystals.