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Ein- und Mehrkristallspektrometrie und Fragen der Abbildung |
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| Authors: | J. Auleytner |
| Abstract: | Methods are discussed allowing to improve the resolving of the image and to make short time statements on the defect structure and characteristics of semiconductors. A monocrystal spectrometer method developed in 1970 by the author and afterwards the capacity of multi-crystal spectrometers are treated. |
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