Using temperature-switching approach to evaluate the ELDRS of bipolar devices |
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| Authors: | Xiaolong Li Xin Wang Qi Guo Xin Yu Chengfa He |
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| Institution: | 1. Key Laboratory of Functional Materials and Devices for Special Environments of CAS, Urumqi, People’s Republic of China;2. Xinjiang Key Laboratory of Electronic Information Material and Device, Xinjiang Technical Institute of Physics &3. Chemistry, Urumqi, People's Republic of China;4. Xinjiang Technical Institute of Physics &5. Chemistry, University of Chinese Academy of Sciences, Beijing, People's Republic of China |
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| Abstract: | Enhanced low-dose rate sensitivity (ELDRS) exhibited at low-dose rates (LDRs) by most bipolar devices is considered as one of the main concerns for spacecraft reliability. In this work, a time-saving and conservative approach – temperature-switching approach (TSA) – to simulate the ELDRS of bipolar devices is presented. Good agreement is observed between the predictive curve obtained with the TSA and the LDR data, and TSA provides us with a new insight into the test technique for ELDRS. Additionally, the mechanisms of TSA are analyzed in this paper. |
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| Keywords: | Bipolar technology Co-60 gamma irradiation enhanced low-dose rate sensitivity (ELDRS) temperature-switching approach (TSA) |
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