Improving surface‐analysis methods for characterization of advanced materials by development of standards,reference data,and interlaboratory comparisons |
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Authors: | D. R. Baer |
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Affiliation: | Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, WA 99352Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, WA 99352, USA. |
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Abstract: | This paper summarizes the results of two surveys examining current needs for improved analyses of surfaces. Surfaces and interfaces are increasingly important to science and technologies associated with nanoparticles, nano‐structured materials and other complex materials including those associated with information systems and medical or biological applications. Adequate characterization of advanced materials frequently requires application of more than one analysis method along with the need to analyze data in increasingly sophisticated and sometimes interrelated ways. It is useful for both new and experienced analysts to have ready access to best practices for obtaining accurate and useful information from a variety of different analysis tools. The International Organization for Standardization (ISO) Committee TC 201 on surface chemical analysis and the ASTM Committee E‐42 on surface analysis are working to address these needs by assembling guides and standards reflecting the collective experience and wisdom of experts in this community. Published in 2007 by John Wiley & Sons, Ltd |
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Keywords: | surface analysis X‐ray photoelectron spectroscopy XPS Auger electron spectroscopy AES surface standards reference data advanced materials analysis ISO TC201 ASTM E42 |
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