Statistical properties of the sum of partially-developed,correlated speckle patterns |
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Authors: | J Ohtsubo T Asakura |
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Institution: | (1) Research Institute of Applied Electricity, Hokkaido University, Sapporo, Hokkaido, Japan |
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Abstract: | General formulas for the average contrast and probability density function of the sum ofN partially-developed, correlated speckle patterns have been theoretically derived. These two parameters characterizing the
statistical properties of added speckle patterns have been actually evaluated for the sum of two partially-developed, correlated
speckle patterns and shown in figures as a function of the surface roughness of illuminated objects, the wavelength difference
of two illuminating lights, and the number of scattering cells within the illuminated area of objects. |
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Keywords: | 42 10 42 30 |
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