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靶丸壳层厚度及其分布的白光反射光谱测量技术
引用本文:樊婷, 马小军, 王宗伟, 等. 靶丸壳层厚度及其分布的白光反射光谱测量技术[J]. 强激光与粒子束, 2021, 33: 092002. doi: 10.11884/HPLPB202133.210179
作者姓名:樊婷  马小军  王宗伟  王琦  何智兵  易勇
作者单位:1.中国工程物理研究院 激光聚变研究中心,四川 绵阳 621900;;2.西南科技大学 材料科学与工程学院,四川 绵阳 621010
基金项目:科学挑战专题项目(TZ2018006)
摘    要:为了精密检测靶丸壳层厚度及其分布数据,开展了靶丸壳层厚度及其分布的白光反射光谱测量技术研究。介绍了靶丸壳层的白光反射光谱及其光谱数据处理方法(极值法、峰值拟合法、干涉级次校正法等)的基本原理,搭建了基于白光反射光谱的精密回转轴系测量装置;开展了GDP靶丸壳层厚度及其分布的白光反射光谱测量、数据处理和可靠性验证实验,获得了靶丸壳层厚度圆周分布曲线。结果表明,基于峰值拟合法和干涉级次校正的白光反射光谱技术可实现靶丸壳层厚度及其分布的准确测量,其测量误差小于0.1 μm。

关 键 词:白光反射光谱   厚度分布   峰值拟合法   干涉级次校正法   靶丸
收稿时间:2021-05-12
修稿时间:2021-09-02

White light spectroscopy technology for measuring the uniformity of capsule shell thickness
Fan Ting, Ma Xiaojun, Wang Zongwei, et al. White light spectroscopy technology for measuring the uniformity of capsule shell thickness[J]. High Power Laser and Particle Beams, 2021, 33: 092002. doi: 10.11884/HPLPB202133.210179
Authors:Fan Ting  Ma Xiaojun  Wang Zongwei  Wang Qi  He Zhibing  Yi Yong
Affiliation:1. Laser Fusion Research Center, CAEP, Mianyang 621900, China;;2. School of Materials Science and Engineering, Southwest University of Science and Technology, Mianyang 621010, China
Abstract:To measure accurately the thickness and its distribution of capsule, the white light reflection spectrum measurement technology is studied. The basic principle of white light reflection spectrum and the corresponding data processing methods, such as the extreme value method, the peak fitting method and the interference order correction method, are analyzed. Based on the white light reflection spectrum and the precision rotary axis system, the measuring apparatus applied to determine the shell thickness and its distribution of the capsule is developed. The white light reflectance spectrum measurement, data processing and reliability verification experiments of GDP capsule are carried out and the circular thickness distribution curve of capsule is obtained. The research results show that the thickness and its distribution of capsule can be measured accurately by white light reflectance spectrum technology based on spectral peak fitting method and interference order correction method and the measurement error is less than 0.1 μm.
Keywords:white light reflection spectroscopy  thickness distribution  peak fitting method  interference order correction method  capsule
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