测量宇生μ子寿命验证堆积事例处理新方法

提出了一种在数据分析中降低堆积事例误差的一种修正方法，并通过塑料闪烁体搭建的宇生μ子时间符合探测器开展寿命测量实验进行验证。寿命测量实验研究表明，主要本底事件来自电子学噪声和堆积事例。为了弥补在本地实验室中，μ子衰变事例在总体宇生μ子事例中较为稀有的短板，我们使用蒙特卡罗模拟程序产生大样本量，进一步验证该分析方法的有效性。修正后的最终实验结果为$tau_{mu}^{rm exp} = 2.19 pm 0.07$ μs，而修正前的实验结果为$tau_{mu}' = 2.27 pm 0.07$ μs。(95%置信度水平)。预计，统计学处理堆积事例的方法将适用于符合测量与堆积事例伴生的同类型实验。

An Improved Treatment of Pile-up Events Demonstrated by a Cosmic Muon Lifetime Measurement Experiment

A statistical correction method is proposed to suppress the pile-up background events in data analysis. This method is verified by a cosmic muon lifetime measurement experiment, achieved by a plastic scintillator detector using the timing coincidence method, where dominant background events originate from pile up muons and electronic noise. To complement the intrinsic shortcoming of relatively rare decay events from registered cosmic muon events in the local laboratory, Monte Carlo simulation is applied to generate large samples in order to cross check the new method. The measurement of the muon lifetime in our setup gives a result of $tau_mu^{rm exp} = 2.19 pm 0.07 mu text{s}$ at 95% confidence level, while the result before applying the correction is $tau_{mu}' = 2.27 pm 0.07 ~mu text{s}$ (95% C.L.). The treatment of pile-up events by a statistical correction equation in this study might be adapted to improve data analysis in the general coincident background dominating experiments.