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Application of wavelet transform to hologram analysis: three-dimensional location of particles
Authors:Cristina Buraga-Lefebvre, S  bastien Coë  tmellec, Denis Lebrun,Cafer   zkul
Affiliation:

G2O (Groupe d'Optique et d'Optronique), UMR 6614 CORIA, Université de Rouen, 76821 Mont-Saint-Aignan, France

Abstract:The wavelet analysis provides an efficient tool in numerous signal-processing problems and has been implemented in optical processing techniques, such as in-line holography. When the diffraction pattern recorded on a hologram is analyzed by means of a wavelet transform, the 3-D location of small particles can be determined very accurately. The diffraction process can, in fact, be interpreted as a convolution with a family of wavelet functions, or, merely, as a wavelet transform. The scale parameter of the wavelet family is related to the axial distance z that the wave propagates. The original field is then reconstructed by searching for the optimum value of the scale parameter which produces a maximum of the wavelet transform modulus. The technique proposed is implemented and experimental results are presented.
Keywords:In-line holography   WT (wavelet transform)   Holographic particle measurements   Spray analysis   3-D location
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