| 一种红外光谱发射率测量装置的研制 |
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| 引用本文： | 万志,任建伟,李宪圣,刘则洵.一种红外光谱发射率测量装置的研制[J].发光学报,2008,29(1):200-203. |
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| 作者姓名： | 万志 任建伟 李宪圣 刘则洵 |
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| 作者单位： | 1. 中国科学院长春光学精密机械与物理研究所, 吉林, 长春, 130033;2. 中国科学院研究生院, 北京, 100049 |
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| 摘 要： | 研制了一种利用对称双光路比对法测量材料表面光谱发射率的装置,该装置采用多光谱辐射测温技术测量材料表面温度,解决了不规则材料表面温度难以精确测定的问题,实现了材料表面半球发射率和表面温度的同时测定。
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| 关 键 词： | 发射率 辐射测温 多光谱测温 |
| 文章编号： | 1000-7032（2008）01-0200-04 |
| 收稿时间： | 2007-08-25 |
| 修稿时间： | 2007-11-24 |
The Development of a Kind of Apparatus for Measuring Infrared Spectral Emissivity |
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| WAN Zhi,REN Jian-wei,LI Xian-sheng,LIU Ze-xun.The Development of a Kind of Apparatus for Measuring Infrared Spectral Emissivity[J].Chinese Journal of Luminescence,2008,29(1):200-203. |
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| Authors: | WAN Zhi REN Jian-wei LI Xian-sheng LIU Ze-xun |
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| Institution: | 1. Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China;2. Graduate School of Chinese Academy of Sciences, Beijing 100049, China |
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| Abstract: | A kind of spectral emissivity measuring apparatus has been developed, which can perform spectral emissivity measurement by means of comparing two symmetric beam paths. The apparatus can be used to measure the surface temperature of material by utilizing multispectral pyrometry, and the problem that irregular surface temperature of material is hard to be exactly measured was resolved. The surface emissivity and surface temperature measurements were realized synchronously. |
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| Keywords: | emissivity pyrometry multispectral pyrometry |
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