Precision and accuracy in standards analysis by PIXE |
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| Authors: | S Y Waksman A Pape Ch Heitz |
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| Institution: | (1) Centre de Recherches Nucléaires, B.P. 28, 67037 Strasbourg Cédex 2, France |
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| Abstract: | Four different approaches to PIXE data obtained in repeated measurements on thick standards have been evaluated in terms of precision and accuracy. Both were found to be the best when determinations relative to an external standard were normalized to a composition assumed to be 100% oxides. |
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