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The influence of the growth temperature and interruption time on the crystal quality of InGaAs/GaAs QW structures grown by MBE and MOCVD methods |
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| Authors: | A. Jasik, A. Wnuk, A. W jcik-Jedli&#x ska, R. Jakie&#x a, J. Muszalski, W. Strupi&#x ski,M. Bugajski |
| Affiliation: | aInstitute of Electron Technology, Al. Lotników 32/46, 02-668 Warsaw, Poland bInstitute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland cInstitute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland |
| Abstract: | The impact of two technological parameters, i.e., the growth temperature and the interface growth interruption, on the crystal quality of strained InGaAs/GaAs quantum well (QW) structures was studied. The investigated heterostructures were grown by molecular beam epitaxy (MBE) and metalorganic chemical vapour deposition (MOCVD) under As-rich conditions. Photoluminescence (PL), reflection high-energy electron diffraction (RHEED) and atomic force microscopy (AFM) were adopted for the evaluation of specified interfaces smoothness and the quality of layers. Comparison between both epitaxial techniques allowed us to find, that the growth temperature plays more significant role in the case of structures grown by MBE technique, whereas the quality of MOCVD grown structures is more sensitive to the growth interruption. Optimum values of the investigated parameters of QW crystallization were obtained for both growth techniques. |
| Keywords: | A1. Interfaces A1. Roughening A3. Quantum wells A3. MBE A3. MOCVD B2. Semiconducting III–V materials |
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