Numerical analysis of long wavelength infrared HgCdTe photodiodes

We present a detailed investigation of the performance limiting factors of long and very long wavelength infrared (LWIR and VLWIR) p on n Hg_1−xCd_xTe detectors through numerical simulations at 77 K incorporating all considerable generation-recombination (G-R) mechanisms including trap assisted tunneling (TAT), Shockley-Read-Hall (SRH), Auger and radiative processes. The results identify the relative strengths of the dark current generation mechanisms by numerically extracting the contribution of each G-R mechanism to the detector characteristics with various cut-off wavelengths (λ_c) and practically achievable material parameters.The results show that the dominant sensitivity degrading trap level depends on the detector cut-off wavelength being ∼0.7E_g for LWIR HgCdTe sensors (λ_c = ∼10 μm) instead of 0.5E_g which is generally believed to be the most efficient R-G level. TAT related 1/f noise dominates the sensor noise even under small reverse bias voltages at a trap density as low as 1 × 10¹⁴ cm⁻³ for sensors with λ_c > 11 μm. Considering the fact that trap densities below this level are rarely reported for HgCdTe material, exceptionally trap-free material is required to achieve desirable imaging performance with these sensors. Simulation results show that Auger mechanism has twofold effect on the sensitivity of the sensor by increasing the dark current and decreasing the photo current of the detector.