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Comparison of SEM and optical analyses of DT neutron tracks in CR-39 detectors |
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| Authors: | P.A. Mosier-Boss L.P.G. ForsleyP. Carbonnelle M.S. MoreyJ.R. Tinsley J.P. HurleyF.E. Gordon |
| Affiliation: | a SPAWAR Systems Center Pacific, Code 71730, San Diego, CA 92152, USA b JWK International Corp., Annandale, VA 22003, USA c Université catholique de Louvain, B-1348 Louvain-la-Neuve, Belgium d National Security Technologies, LLC, Special Technologies Laboratory, Santa Barbara, CA 93111, USA |
| Abstract: | A solid state nuclear track detector, CR-39, was exposed to DT neutrons. After etching, the resultant tracks were analyzed using both an optical microscope and a scanning electron microscope (SEM). In this communication, both methods of analyzing DT neutron tracks are discussed. |
| Keywords: | CR-39 Neutrons Microscopy |
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