X-ray diffraction study on amorphous gallium |
| |
Authors: | Adnan Bererhi Louis Bosio Robert Corts |
| |
Institution: | CNRS (G.R. no. 4), 4 Place Jussieu, T. 22, 75230, Paris 05, France |
| |
Abstract: | Amorphous films of some μm in thickness, prepared by low temperature condensation in an ultra-high vacuum onto liquid helium cooled substrates, have been studied in situ by using an X-ray diffractometer operating in a symmetrical reflection mode. The structure factor of gallium has been obtained over the wavevector range 1.3 to 16.1 Å− by means of two wavelengths, CrK and MoK , monochromatized by balanced filters. The average number of nearest neighbours deduced from the well-resolved first maximum in the radial distribution function is equal to 9.3 atoms. The results are compared to those previously found by electron diffraction measurements on thin films and also to the structure of supercooled liquid. |
| |
Keywords: | |
本文献已被 ScienceDirect 等数据库收录! |
|