Defect assisted subwavelength resolution in III-V semiconductor photonic crystal flat lenses with n = −1 |
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| Authors: | Maxence Hofman |
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| Institution: | Institut d’Electronique, de Micro-électronique et de Nanotechnologie (IEMN), UMR CNRS 8520, Université des Sciences et Technologies de Lille, Avenue Poincaré, BP60069, 59655 Villeneuve d’Ascq Cedex, France |
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| Abstract: | We propose a III-V semiconductor photonic crystal slab designed to operate as a n = −1 superlens at λ0 = 1.55 μm. The structure consists of air holes arranged in a two-dimensional triangular lattice, of period a, nanopatterned in an InP/InGaAsP/InP slab. Exploiting the second pass-band regime (a/λ0 ∼ 0.31), subwavelength resolutions as low as 0.38λ0 for planar lenses have been obtained by the insertion of hexagonal nanocavities within the crystal. |
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