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用于平面靶X射线诊断的1维KBA显微镜
引用本文:伊圣振,穆宝忠,王新,蒋励,朱京涛,王占山,方智恒,王伟,傅思祖.用于平面靶X射线诊断的1维KBA显微镜[J].强激光与粒子束,2012,24(5):1076-1080.
作者姓名:伊圣振  穆宝忠  王新  蒋励  朱京涛  王占山  方智恒  王伟  傅思祖
作者单位:1.同济大学 教育部先进微结构材料重点实验室, 上海 200092;
基金项目:国家自然科学基金科学仪器专项,上海市青年科技启明星计划项目,教育部新世纪优秀人才支持计划项目,国家自然科学基金,上海市科学技术委员会优秀学科带头人计划项目
摘    要:对用于神光Ⅱ装置4.75 keV能点平面靶成像诊断的1维KBA显微镜进行了实验研究。基于空间分辨力和工作环境要求,设计了1维KBA显微镜的光学结构,并与传统KB显微镜的成像性能进行了对比分析。设计和制备了可同时工作于8 keV和4.75 keV能点的双能点多层膜KBA物镜,解决了系统装调问题。利用神光Ⅱ装置第九路激光打击Ti靶产生的X射线作为背光源照射1 500目金网,进行了4.75 keV网格成像实验,结果表明:在整个背光源照明区域内,系统的实际分辨力约为4 m,系统的有效视场受背光源大小的限制。

关 键 词:瑞利-泰勒不稳定性    X射线诊断    KBA显微镜    KB显微镜    平面靶
收稿时间:2011/9/16

One-dimensional KBA microscope for planar target diagnosis
Yi Shengzhen , Mu Baozhong , Wang Xin , Jiang Li , Zhu Jingtao , Wang Zhanshan , Fang Zhiheng , Wang Wei , Fu Sizu.One-dimensional KBA microscope for planar target diagnosis[J].High Power Laser and Particle Beams,2012,24(5):1076-1080.
Authors:Yi Shengzhen  Mu Baozhong  Wang Xin  Jiang Li  Zhu Jingtao  Wang Zhanshan  Fang Zhiheng  Wang Wei  Fu Sizu
Institution:1.Key Laboratory of Advanced Micro-structured Materials,Ministry of Education,Tongji University,Shanghai 200092,China;2.Institute of Precision Optical Engineering,Tongji University,Shanghai 200092,China;3.Shanghai Institute of Laser Plasma,CAEP,Shanghai 201800,China
Abstract:A one-dimensional KBA microscope for diagnosis of planar targets, working at 4.75 keV, has been experimentally studied. According to the requirements of spatial resolution and working environments, the optical structure of one-dimensional KBA microscope was designed, and compared with conventional Kirkpatrick-Baez microscope. A double-periodic multilayer KBA mirror simultaneously working at 8 keV and 4.75 keV was adopted and manufactured to complete the system alignment. The 4.75 keV X-ray imaging experiment in XRL chamber of Shenguang Ⅱ shows that the resolution is about 4 μm in all the illumination area of backlighter, and the effective field of the one-dimensional KBA microscope is limited by backlighter size.
Keywords:Rayleigh-Taylor instability  X-ray diagnostics  KBA microscope  Kirkpatrick-Baez microscope  planar target
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