Optimized sample preparation procedures for the analysis of solid materials by total-reflection XRF

The total reflection X-ray fluorescence (TXRF) method has been used for the analysis of various types of solid materials of biological, geological and environmental origin. The sample preparation step prior to TXRF measurements has been optimized for the various solid samples, including their decomposition by applying both a microwave oven and a PTFE bomb. Complete procedures for the optimized decomposition from the point of view of speed and completeness of digestion, as well as of the overall precision and accuracy are presented.