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Ti-2Al-2.5Zr合金He离子辐照效应研究
引用本文:何晓,封向东,周继萌,刘彦章,祖小涛. Ti-2Al-2.5Zr合金He离子辐照效应研究[J]. 强激光与粒子束, 2006, 18(7): 1208-1210
作者姓名:何晓  封向东  周继萌  刘彦章  祖小涛
作者单位:电子科技大学,应用物理系,成都,610054;四川大学,辐射物理及技术教育部重点实验室,成都,610064
基金项目:国家自然科学基金委员会-中国工程物理研究院联合资助项目;国家重点实验室基金
摘    要: 在Ti-2Al-2.5Zr合金中注入能量为75 keV的He离子,注入剂量分别为5×1016cm-2,1×1017 cm-2。通过显微硬度测量和剖面电子显微观察,研究了He离子对Ti-2Al-2.5Zr合金力学性能和显微组织的影响。结果表明:样品的显微硬度随He离子注量的增加而升高,在温度为350和550 ℃的Ar气中退火后硬度有所下降。剖面电子显微观察发现有位错环和He气泡生成,退火后He气泡有长大、缺陷有回复的趋势。辐照产生的位错环是辐照后硬度升高的直接原因,其退火发生回复又引起硬度随退火温度的升高而降低。

关 键 词:Ti-2Al-2.5Zr合金  离子注入  透射电镜  显微硬度
文章编号:1001-4322(2006)07-1208-03
收稿时间:2006-01-13
修稿时间:2006-06-22

Effect of He on properties and microstructure of Ti-2Al-2.5Zr alloy
HE Xiao,FENG Xiang-dong,ZHOU Ji-meng,LIU Yan-zhang,ZU Xiao-tao. Effect of He on properties and microstructure of Ti-2Al-2.5Zr alloy[J]. High Power Laser and Particle Beams, 2006, 18(7): 1208-1210
Authors:HE Xiao  FENG Xiang-dong  ZHOU Ji-meng  LIU Yan-zhang  ZU Xiao-tao
Affiliation:1. Department of Applied Physics, University of Electronic Science and Technology of China, Chengdu 610054, China;2. Key Laboratory for Radiation Physics and Technology of Ministry of Education, Sichuan University, Chengdu 610064, China
Abstract:Ion-implantation-enhanced hardening and microstructure change of a Ti-2Al-2.5Zr alloy by 75 keV helium ion implantation with the dose of 5×1016 cm-2 or 1×1017 cm-2 is investigated. The maximum temperature during the implantation was monitored to be less than 200 ℃. The base pressure in the vacuum chamber was 6×10-4 Pa, and the working pressure was 1.6×10-3 Pa. The morphology and the structure of the implant samples have been characterized by TEM using a JEOL 2010FEG at 200 keV. The surface characterization of samples was studied by Vickers hardness tests. The He-induced hardening was observed. The He-induced hardening decreases with annealing at 350 ℃ and 550 ℃. The results of TEM analysis show that helium bubbles and dislocation loops are formed in the near surface region. He-ion-i
Keywords:Ti-2Al-2.5Zr alloy   He ion implantation   TEM   Mierohardness
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