| 高速ADC微分相位、微分增益的测试 |
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| 引用本文： | 李迅波,陈光.高速ADC微分相位、微分增益的测试[J].电子学报,2003,31(12):1897-1899. |
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| 作者姓名： | 李迅波 陈光 |
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| 作者单位： | 1. 电子科技大学,四川成都 610054;2. 四川固体物理研究所,重庆 40060 |
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| 摘 要： | 本文采用数字处理技术对高速ADC的微分相位、微分增益的测试方法进行研究,给出了方程式,构建了数字测试系统,完成了高速ADC微分相位及微分增益的测试,该方法适用于大批量的ADC动态参数的测试.
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| 关 键 词： | 微分相位 微分增益 数字处理技术 模数转换 |
| 文章编号： | 0372-2112(2003)12-1897-03 |
| 收稿时间： | 2002-08-12 |
Differential Phase and Differential Gain Testing of Analog-to-Ditital Converters |
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| LI Xun bo ,CHEN Guang ju ,YAN Shun bing.Differential Phase and Differential Gain Testing of Analog-to-Ditital Converters[J].Acta Electronica Sinica,2003,31(12):1897-1899. |
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| Authors: | LI Xun bo CHEN Guang ju YAN Shun bing |
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| Institution: | 1. ;2. Sichuan Institute of Solid-state Circuit,Chongqing 400060,China |
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| Abstract: | Test methods based on DSP for Differential Phase(DP) and Differential Gain(DG) of high speed and log to digital converter (ADC) are studied.And the equations are proposed.The ADC dgnamic test circuit has been built.The high speed ADC converter has been tested using the method;Examples of test results are shown that the method is suitable for measuring DP or DG of an ADC system. |
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| Keywords: | differential Phase differential Gain DSP analog to ditital converters |
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