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Semiconducting properties and band structure of polycrystalline Bi4Mo20O62 compounds
Authors:A Conan  A Bonnet  M Ganne  M Dion
Institution:Laboratoire de Physique des Maténaux et Composants de l''Electronique 2, rue de la Houssinière, 44072 Nantes Cédex, France;Laboratoire de Chimie des Solides, LA 279 (C N.R S) 2, rue de la Houssiniére, 44072 Nantes Cédex, France
Abstract:Transport coefficient measurements (electrical conductivity, thermoelectric power and Hall effect) have been performed on compacted bars of Bi4Mo20O62 in polycrystalline form over the temperature range (130–500 K) Experimental results are discussed in comparison to those obtained recently on Sb4Mo20O62 They are interpreted on the basis of the same p-type semiconductor model with two inverted deep levels near the midgap Conduction mechanisms are governed by acoustical-phonon scattering of the carrriers The top of the valence band is assumed to be formed from the dxy orbitais of some of the Mo atoms leading to narrow bonding bands, while the donor and acceptor levels may be formed from the nonbonding dxy orbitais of some of the Mo atoms of the distorted octahedron framework EPR measurements are discussed on the basis of this model and in comparison to the EPR results for Sb4MO20O62 It is assumed that more than one narrow energy level (localized d states located below the valence band) contributes to the area of the line The XPS spectrum obtained on Bi4Mo20O62 is also discussed.
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