a Department of Physics, Kurukshetra University, Kurukshetra - 136 119, India
b Department of Applied Physics, Regional Engineering College, Kurukshetra - 136 119, India
Abstract:
The samples of CR-39(DOP) and SR-90 polymer track detectors have been exposed to -particles from 241Am source in an exposure unit. The temperature of the detectors during irradiation has been varied from −30°C to 70°C. These exposed samples have been etched in 6.25 N NaOH solution at 60°C for various etching times. The variation of sensitivity of these detectors as a function of registration temperature has been studied. It has been observed that at the fixed registration temperature, the sensitivity of SR-90 is more than CR-39(DOP) polymer track detector. However, the enhancement in sensitivity with the decrease in registration temperature is more pronounced in case of CR-39(DOP) than SR-90.