| 螺旋线慢波结构色散特性与耦合阻抗测量系统误差分析 |
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| 引用本文： | 梁友焕,李镇远,冯进军.螺旋线慢波结构色散特性与耦合阻抗测量系统误差分析[J].真空电子技术,2010(4):51-54. |
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| 作者姓名： | 梁友焕 李镇远 冯进军 |
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| 作者单位： | 北京真空电子技术研究所大功率微波电真空器件技术国防科技重点实验室,北京100015 |
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| 摘 要： | 本文系作者研制的＂螺旋线慢波结构冷特性自动测量系统＂的补充,给出了此类系统测量误差的详细理论分析,并对典型数据进行了计算。结果表明色散特性（相光速比）的测量误差可小于0.5%,基波耦合阻抗的测量误差则可达15%。
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| 关 键 词： | 误差分析 慢波结构 螺旋线行波管 色散特性测量 耦合阻抗测量 |
Error Analysis of the Automatic System of Measuring Dispersion and Interaction Impedance of Helix SWS |
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| LIANG You-huan,LI Zhen-yuan,FENG Jin-jin.Error Analysis of the Automatic System of Measuring Dispersion and Interaction Impedance of Helix SWS[J].Vacuum Electronics,2010(4):51-54. |
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| Authors: | LIANG You-huan LI Zhen-yuan FENG Jin-jin |
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| Institution: | LIANG You-huan, LI Zhen-yuan, FENG Jin-jin (Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing 100015, China) |
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| Abstract: | The error analysis of the automatic measurement system of the cold parameters of the slow wave structure of the helix TWT is completed in this paper. The detailed theoretic analysis of measurement errors is provided and the typical data of the parameters are applied. The results show that the error of the dispersion measurement is less than 0.5 % and the error of the interaction impedance measurement is less than 15%. |
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| Keywords: | Error analysis Slow wave structure Helix TWT Dispersion measurement Interaction impedance measurement |
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