Parallel detection,quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C<sub>60</sub>–Ar co-sputtering 期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

Parallel detection,quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C₆₀–Ar co-sputtering

摘要：
收稿时间：	2011-10-14
修稿时间：	2011-12-25
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