Calculation and analysis of Mueller matrix in light scattering detection |
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| Affiliation: | [1]Department of Information Physics & Engineering, Nanjing University of Science & Technology, Nanjing 210094, China; [2]704 Institute, China Shipbuilding Industry Corporation, Shanghai 200031, China; [3]College of Electronic and Information Engineering, Shanghai University of Electric Power, Shanghai 200090, China; [4]China North Vehicle Research Institute, Beijing 100072, China; [5]Xi'an Modern Control Technology Institute, Xi'an 710065, China |
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| Abstract: | A new criterion for target detection and identification is proposed to realize metal/dielectric identification and recognition based on Mueller matrix analysis. By using randomly rough surfaces as targets, numerical calculations are used to prove the robustness and accuracy of the criterion. Moreover, to the best of our knowledge, this is the first time to successfully explain the criterion by theoretical analysis. We believe the work provides an important reference for polarization imaging in laser radar and remote sensing, and so on. |
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| Keywords: | 290.5880 240.5770 290.0290 240.0240 |
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