| Abstract: | A high-resolution powder diffraction station with synchrotron radiation has been created. The diffractometer was developed on the basis of two Microcontrol precision goniometers. The latter provide the independent movement of a specimen and a detector with a minimal step of 2θ=0.001°. Using the Si(111) crystal as the analyzer, we obtained half widths of the (212), (203), and (301) reflections for α-SiO2 (0.02–0.025° 2θ). The device was tested using α-Al2O3 as the standard. Institute of Catalysis, Siberian Branch, Russian Academy of Sciences. Translated fromZhurnal Strukturnoi Khimii, Vol. 35, No. 2, pp. 85–91, March–April, 1994. Translated by T. Yudanova |
