|
|||||
|
|
MgO films grown on yttria-stabilized zirconia by molecular beam epitaxy |
|
| Authors: | O. Maksimov P. Fisher M. Skowronski P.A. Salvador M. Snyder J. Xu X. Weng |
| Affiliation: | aElectro-Optics Center, Pennsylvania State University, Freeport, PA 16229, USA bDepartment of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA cDepartment of Engineering Science and Mechanics, Pennsylvania State University, University Park, PA 16802, USA dMaterials Research Institute, Pennsylvania State University, University Park, PA 16802, USA |
| Abstract: | MgO films were grown on (0 0 1) yttria-stabilized zirconia (YSZ) substrates by molecular beam epitaxy (MBE). The crystalline structures of these films were investigated using X-ray diffraction and transmission electron microscopy. Growth temperature was varied from 350 to 550 °C, with crystalline quality being improved at higher temperatures. The MgO films had a domain structure: (1 1 1)[1 1 2¯]MgO(0 0 1)[1 0 0]YSZ with four twin variants related by a 90° in-plane rotation about the [1 1 1]MgO axis. The observed epitaxial orientation was compared to previous reports of films grown by pulsed laser deposition and sputtering and explained as resulting in the lowest interface energy. |
| Keywords: | A1. High resolution X-ray diffraction A1. Reflection high energy electron diffraction A1. Growth models B1. Oxides A3. Molecular beam epitaxy |
| 本文献已被 ScienceDirect 等数据库收录！ | |