Numerical analysis of the spectral response of an NSOM measurement |
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Authors: | E C Kinzel and X Xu |
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Institution: | (1) School of Mechanical Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, IN 47907, USA |
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Abstract: | Near-field Scanning Optical Microscopy (NSOM) is a powerful tool for investigating optical field with resolution greater than
the diffraction limit. In this work, we study the spectral response that would be obtained from an aperture NSOM system using
numerical calculations. The sample used in this study is a bowtie nanoaperture that has been shown to produce concentrated
and enhanced field. The near- and far-field distributions from a bowtie aperture are also calculated and compared with what
would be obtainable from a NSOM system. The results demonstrate that it will be very difficult to resolve the true spectral
content of the near-field using aperture NSOM. On the other hand, the far-field response may be used as a guide to the near-field
spectrum. |
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Keywords: | PACS" target="_blank">PACS 07 79 Fc 68 37 Uv 42 79 Gn |
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