Tunneling through a Metal/Polymer Interface Containing a Thin Oxide Layer: Discussion of the Consequences of Oxide Presence on Charge Injection |
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Authors: | M. Koehler I.A. Hümmelgen |
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Affiliation: | (1) Departamento de Física, Universidade Federal do Paraná, Caixa Postal 19081, 81531-990 Curitiba PR, Brazil |
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Abstract: | The charge injection from oxidized metal electrodes into conjugated polymer thin films is calculated and compared with ideal metal/polymer interfaces. The presence of the oxide layer has a major influence on the magnitude of the tunneling current as well as on its behavior with applied voltage. It was also found that the fitting of the simple Fowler-Nordheim model for triangular barriers to the obtained current-voltage data from the oxidized interfaces leads to incorrect values of the potential barrier height at the metal/polymer interface. Prediction and its consequences on charge injection control in organic devices are discussed. |
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Keywords: | metal/polymer interfaces tunneling charge injection organic light emitting diodes |
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