首页 | 本学科首页   官方微博 | 高级检索  
     

表面等离激元结构光照明显微成像技术研究进展
引用本文:张崇磊,辛自强,闵长俊,袁小聪. 表面等离激元结构光照明显微成像技术研究进展[J]. 物理学报, 2017, 66(14): 148701-148701. DOI: 10.7498/aps.66.148701
作者姓名:张崇磊  辛自强  闵长俊  袁小聪
作者单位:深圳大学, 纳米光子学研究中心, 深圳 518060
基金项目:国家自然科学基金(批准号:61427819,61422506,61605118)、国家重点基础研究发展计划(批准号:2015CB352004)和国家重点研发计划(批准号:2016YFC0102401)资助的课题.
摘    要:结构光照明显微成像技术(SIM)因其高分辨、宽场、快速成像的优势,在生物医学成像领域发挥了不可估量的作用.结构光照明显微成像技术与动态可控的亚波长表面等离激元条纹相结合,可以在不借助非线性效应的情况下,将传统SIM的分辨率从2倍于衍射极限频率提升到3 4倍,此外还有抑制背景噪声、提升信噪比的能力,在近表面的生物医学成像应用中有重要价值.本文介绍了表面等离激元结构光照明显微成像技术的原理,并总结了近几年国内外的相关研究进展.

关 键 词:结构光照明  超分辨成像  表面等离激元
收稿时间:2017-03-29

Research progress of plasmonic structure illumination microscopy
Zhang Chong-Lei,Xin Zi-Qiang,Min Chang-Jun,Yuan Xiao-Cong. Research progress of plasmonic structure illumination microscopy[J]. Acta Physica Sinica, 2017, 66(14): 148701-148701. DOI: 10.7498/aps.66.148701
Authors:Zhang Chong-Lei  Xin Zi-Qiang  Min Chang-Jun  Yuan Xiao-Cong
Affiliation:Nanophotonics Research Center, Shenzhen University, Shenzhen 518060, China
Abstract:Structure illumination microscopy (SIM) is a novel imaging technique with advantages of high spatial resolution, wide imaging field and fast imaging speed. By illuminating the sample with patterned light and analyzing the information about Moiré fringes outside the normal range of observation, SIM can achieve about 2-fold higher in resolution than the diffraction limit, thus it has played an important role in the field of biomedical imaging. In recent years, to further improve the resolution of SIM, people have proposed a new technique called plasmonic SIM (PSIM), in which the dynamically tunable sub-wavelength surface plasmon fringes are used as the structured illuminating light and thus the resolution reaches to 3-4 times higher than the diffraction limit. The PSIM technique can also suppress the background noise and improve the signal-to-noise ratio, showing great potential applications in near-surface biomedical imaging. In this review paper, we introduce the principle and research progress of PSIM. In Section 1, we first review the development of optical microscope, including several important near-field and far-field microscopy techniques, and then introduce the history and recent development of SIM and PSIM techniques. In Section 2, we present the basic theory of PSIM, including the dispersion relation and excitation methods of surface plasmon, the principle and imaging process of SIM, and the principle of increasing resolution by PSIM. In Section 3, we review the recent research progress of two types of PSIMs in detail. The first type is the nanostructure-assisted PSIM, in which the periodic metallic nanostructures such as grating or antenna array are used to excite the surface plasmon fringes, and then the shift of fringes is modulated by changing the angle of incident light. The resolution of such a type of PSIM is mainly dependent on the period of nanostructure, thus can be improved to a few tens of nanometers with deep-subwavelength structure period. The other type is the all-optically controlled PSIM, in which the structured light with designed distribution of phase or polarization (e.g. optical vortex) is used as the incident light to excite the surface plasmon fringes on a flat metal film, and then the fringes are dynamically controlled by modulating the phase or polarization of incident light. Without the help of nanostructure, such a type of PSIM usually has a resolution of about 100 nm, but benefits from the structureless excitation of plasmonic fringes in an all-optical configuration, thereby showing more dynamic regulation and reducing the need to fabricate nanometer-sized complex structures. In the final Section, we summarize the features of PSIM and discuss the outlook for this technique. Further studies are needed to improve the performance of PSIM and to expand the scope of practical applications in biomedical imaging.
Keywords:structure illumination microscopy  super-resolution imaging  surface plasmon
本文献已被 CNKI 等数据库收录!
点击此处可从《物理学报》浏览原始摘要信息
点击此处可从《物理学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号