| 中能高浓度氦离子注入对钨微观结构的影响 |
| |
| 引用本文： | 郭洪燕,夏敏,燕青芝,郭立平,陈济红,葛昌纯.中能高浓度氦离子注入对钨微观结构的影响[J].物理学报,2016,65(7):77803-077803. |
| |
| 作者姓名： | 郭洪燕 夏敏 燕青芝 郭立平 陈济红 葛昌纯 |
| |
| 作者单位： | 1. 中国矿业大学(北京), 深部岩土力学与地下工程国家重点实验室, 北京 100083;
2. 北京科技大学材料科学与工程学院, 特种陶瓷粉末冶金研究所, 北京 10083;
3. 武汉大学物理科学与技术学院加速器实验室, 武汉 430072 |
| |
| 基金项目： | 国家重点基础研究发展计划 (批准号: 2010GB109000, 2014GB123000)资助的课题. |
| |
| 摘 要： | 采用15 keV, 剂量1×1017/cm2, 温度为600 ℃氦离子注入钨, 分别以块体钨研究氦离子对钨的表面损伤; 以超薄的钨透射电镜样品直接注入氦离子, 研究该条件下钨的微观结构变化, 以了解氦离子与钨的相互作用过程; 采用扫描电子显微镜、聚焦离子束扫描显微镜、透射电子显微镜、高分辨透射电子显微镜等分析手段研究氦离子注入对钨表面显微结构的影响及氦泡在钨微观结构演化中的作用.
|
| 关 键 词： | 钨 中能高浓度氦离子 氦泡 显微结构 |
| 收稿时间： | 2015-09-21 |
Microstructure of medium energy and high density helium ion implanted tungsten |
| |
| Guo Hong-Yan,Xia Min,Yan Qing-Zhi,Guo Li-Ping,Chen Ji-Hong,Ge Chang-Chun.Microstructure of medium energy and high density helium ion implanted tungsten[J].Acta Physica Sinica,2016,65(7):77803-077803. |
| |
| Authors: | Guo Hong-Yan Xia Min Yan Qing-Zhi Guo Li-Ping Chen Ji-Hong Ge Chang-Chun |
| |
| Institution: | 1. State Key Laboratory for Geomechanics and Deep Underground Engineering, China University of Mining and Technology, Beijing 100083, China;
2. Institute of Special Ceramics and Powder Metallurgy, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083, China;
3. Accelerator Laboratory, School of Physics and Technology, Wuhan University, Wuhan 430072, China |
| |
| Abstract: | Bulk tungsten and tungsten transmission electron microscopy (TEM) lamella are implanted with 15 keV helium ions at about 873 K to study the microstructure evolution. The samples are implanted to about 1×1017 He+/cm2. The projected range of the helium ion in tungsten is about 43.9 nm, calculated with the stopping and range of ions in matter program (the SRIM code). The density of pores with diameters ranging from 90 nm to 430 nm is detected on the surface of helium implanted bulk tungsten by field emission scanning electron microscopy. Blistering is also observed on the surface of helium implanted bulk tungsten. The TEM results indicate that fuzz microstructure is formed in helium implanted tungsten TEM lamella, and stacking faults and micro-pores are observed in the fuzz structure. Besides, the density of nano-scaled helium bubbles is detected around the mirco-pores. |
| |
| Keywords: | tungsten medium energy and high density He+ implanted helium bubbles microstructures |
|
| 点击此处可从《物理学报》浏览原始摘要信息 |
| 点击此处可从《物理学报》下载免费的PDF全文 |
|
