A method of quantitative analysis based on ion bombardment induced secondary ion and photon emission |
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| Authors: | R.J. MacDonald R.F. Garrett |
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| Affiliation: | Department of Physics, The Australian National University, ACTCanberra, 2601Australia |
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| Abstract: | An absolute method of quantitative analysis using both secondary ion and photon emission is described. The method has been applied to the analysis of some NBS steel and Fe/Cr/Ni alloys, with good results. Enhancement of signal strength by means of an O+2 beam or O2 adsorption is not necessary for this method. |
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