An evaluation method for nanoscale wrinkle |
| |
| Institution: | 1. Center for Composite Materials, Harbin Institute of Technology, Harbin 150080, China;2. National Key Laboratory of Science and Technology on Advanced Composites in Special Environments, Harbin Institute of Technology, Harbin 150080, China;3. Department of Information Engineering, Harbin Institute of Technology, Harbin 150001, China;2. Volgograd State Technical University, 400005 Volgograd, Russia;1. International Laboratory for Quantum Functional Materials of Henan, and School of Physics and Engineering, Zhengzhou University, Henan 450001, China;2. Center for Clean Energy and Quantum Structures, Zhengzhou University, Zhengzhou, Henan 450001, China;3. Department of Physics, Henan University of Technology, Zhengzhou, Henan 450052, China;4. Department of Basic Courses, Zhengzhou College of Science & Technology, Zhengzhou 450064, China;1. Department of Physics and Research Institute of Physics and Chemistry, Chonbuk National University, Jeonju 561–756, Korea;2. Thin Films Research Center, Korea Research Institute of Chemical Technology, Daejeon 305–600, Korea |
| |
| Abstract: | In this paper, a spectrum-based wrinkling analysis method via two-dimensional Fourier transformation is proposed aiming to solve the difficulty of nanoscale wrinkle evaluation. It evaluates the wrinkle characteristics including wrinkling wavelength and direction simply using a single wrinkling image. Based on this method, the evaluation results of nanoscale wrinkle characteristics show agreement with the open experimental results within an error of 6%. It is also verified to be appropriate for the macro wrinkle evaluation without scale limitations. The spectrum-based wrinkling analysis is an effective method for nanoscale evaluation, which contributes to reveal the mechanism of nanoscale wrinkling. |
| |
| Keywords: | Thin film Wrinkle Spectrum analysis Wrinkling wavelength |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
