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Dependence of electronic and optical properties of multilayer SiC and GeC on stacking sequence and external electric field
Institution:1. Department of Physics, Tianjin University Ren''ai College, Tianjin 301636, PR China;2. School of Physics, Nankai University, Tianjin 300071, PR China;1. Department of Physics, Faculty of Science, Arak University, Arak 38156, Iran;2. Physics department, Sharif University of Technology, Tehran 14588, Iran;3. Department of Physics, Faculty of Science, Alzahra University, Tehran, Iran;1. Department of Physics, Dokuz Eylül University, 35160 ?zmir, Turkey;2. Department of Physics, Adnan Menderes University, 09100 Ayd?n, Turkey
Abstract:The electronic and optical properties of different stacked multilayer SiC and GeC are investigated with and without external electric field (EEF). The band gaps of multilayer SiC and GeC are found smaller than that of monolayer SiC and GeC due to the interlayer coupling effect. When EEF is applied, the direct band gaps (ΔKM) of multilayer SiC and direct band gaps (ΔKK) of multilayer GeC all turn to indirect band gaps (ΔKG) as the band at the G point drops dramatically toward zero. The imaginary part ε2(ω)s of multilayer SiC and GeC show that new absorption peaks between 2–5 eV appear when the polarized direction is perpendicular to the layer plane, and new absorption peaks in infrared region appear as the EEF is higher than a certain point when the polarized direction is parallel to the layer plane. Our calculations reveal that different stacking sequences and EEF can provide a wide tunable band structures and optical properties for multilayer SiC and GeC.
Keywords:Multilayer SiC and GeC  Stacking sequence  External electric field  Electronic and optical properties
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