Correction of STM tip convolution effects in particle size and distance determination of metal-C:H films |
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Authors: | K. I. Schiffmann Matthias Fryda Günther Goerigk Rolf Lauer Peter Hinze |
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Affiliation: | Fraunhofer Institut Schicht und Oberfl?chentechnik, Bienroder Weg 54E, D-38108 Braunschweig, Germany, DE Forschungszentrum Jülich, D-52425 Jülich, Germany, DE Physikalisch-Technische Bundesanstalt, D-38023 Braunschweig, Germany, DE
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Abstract: | Metal containing amorphous hydrocarbon films consist of nanometer size metallic particles in a hydrogen-carbon matrix. Scanning tunneling microscopy (STM) of Au and Pt containing amorphous C:H-films was performed in order to determine particle size- and distance distributions. To correct tip convolution effects, which lead to apparent particle enlargement and particle hiding (1) a method is presented which allows off-line STM tip radius determination by statistical analysis of apparent particle radii and thereby a correct particle radii determination. (2) A simple Monte Carlo model is proposed to compute fractions of hidden particles and their influence on particle distance distributions. Results of these evaluations are compared with results from small angle X-ray scattering (SAXS), transmission electron microscopy (TEM) and X-ray diffraction (XRD). |
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