| 偏振相位偏移电子散斑干涉术及其应用于变形测量 |
| |
| 引用本文： | 金观昌 唐寿鸿. 偏振相位偏移电子散斑干涉术及其应用于变形测量[J]. 光学学报, 1990, 10(2): 61-164 |
| |
| 作者姓名： | 金观昌 唐寿鸿 |
| |
| 作者单位： | 清华大学工程力学系 北京(金观昌)，奥克兰大学机械工程系 美国(唐寿鸿) |
| |
| 摘 要： | 本文叙述了一种用于测量漫射表面变形的使用偏振相位偏移技术的电子散斑干涉术.由于采用共光路光学相位偏移技术,因而具有较高的稳定性;用计算机图像处理可精确地获得相位图;用去包裹技术(unwrapping)可直接得到表面变形的精确数据.
|
| 关 键 词： | 电子 散斑干涉法 相位 变形 测量 |
| 收稿时间： | 1989-03-07 |
Electronic speckle-pattern interferometry with polarization phase-shifting technique and it''''s application to deformation measurements |
| |
| JIN GUANCHANG. Electronic speckle-pattern interferometry with polarization phase-shifting technique and it''''s application to deformation measurements[J]. Acta Optica Sinica, 1990, 10(2): 61-164 |
| |
| Authors: | JIN GUANCHANG |
| |
| Abstract: | An E. S. P. I. with polarization phase-shifting technique for the deformation measorements of diffused surface is presented. The high stability is obtained by adopting the common-path optical phase-shifting technique. A phase map can be precisely obtained from computer image processing technique. The precise data of surface deformation are extracted directly by unwrapping technique. |
| |
| Keywords: | polarization phase measurement deformation measurements elec-tronic speckle-pattern interferometry. |
| 本文献已被 CNKI 维普 等数据库收录！ |
