Early stages of oxide growth in H-terminated silicon nanowires: determination of kinetic behavior and activation energy |
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Authors: | Muhammad Y Bashouti Kasra Sardashti Juergen Ristein Silke H Christiansen |
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Institution: | Max Planck Institute for the Science of Light, Günther-Sharowsky-str. 1, D-91058 Erlangen, Germany. silke.christiansen@mpl.mpg.de. |
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Abstract: | Silicon nanowires (Si NWs) terminated with hydrogen atoms exhibit higher activation energy under ambient conditions than equivalent planar Si(100). The kinetics of sub-oxide formation in hydrogen-terminated Si NWs derived from the complementary XPS surface analysis attribute this difference to the Si-Si backbond and Si-H bond propagation which controls the process at lower temperatures (T < 200 °C). At high temperatures (T≥ 200 °C), the activation energy was similar due to self-retarded oxidation. This finding offers the understanding of early-stage oxide growth that affects the conductance of the near-gap channels leading towards more efficient Si NW electronic devices. |
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