Elastic modulus of supercooled liquid and hot solid silicon measured by inelastic X-ray scattering |
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Authors: | A. Alatas A.H. Said H. Sinn C.N. Kodituwakku B. Reinhart M.-L. Saboungi |
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Affiliation: | a Advanced Photon Source, Argonne National Laboratory, Building 431, 9700 South Cass Avenue, Argonne, IL 60439, USA b Western Michigan University, Kalatmzoo, MI 49008, USA c Purdue University, West Lafayette, IN, USA d CRMD, Orleans, France e CRMTH, Orleans, France |
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Abstract: | The dynamical structure factors of supercooled-liquid and hot-solid silicon are measured by inelastic X-ray scattering at the same temperature, 1620 K. Two significant changes in the averaged longitudinal sound velocities and in the longitudinal modulus are observed. First, we observe a different longitudinal modulus in the polycrystalline hot-solid silicon compared to the extrapolated value obtained from the single-crystal measurement. This reduction of the modulus may be a precursor of the semiconductor-to-metal transition. Second, the increase in the longitudinal modulus in the liquid upon supercooling is consistent with an increase in the degree of the directional bonding. |
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Keywords: | A. Metals D. Elastic properties D. Lattice dynamics D. Phonons |
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