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m线法研究掺杂LiNbO3晶体波导基片的光损伤
引用本文:许世文 袁菌. m线法研究掺杂LiNbO3晶体波导基片的光损伤[J]. 光子学报, 1994, 23(2): 179-183
作者姓名:许世文 袁菌
作者单位:1. 哈尔滨工业大学空间工程系, 哈尔滨, 150006;2. 哈尔滨工业大学应用物理系, 哈尔滨, 150006
摘    要:采用m线法研究了掺杂LiNbO3晶体波导基片的光损伤,发现抗光损伤能力依次为Mg:LiNbO3、LiNbO3、Fe:LiNbO3(氧化),Fe:LiNbO3(还原).对于同样材料,质子交换光波导的抗光损伤能力高于钛扩散光波导。

关 键 词:m线法  掺杂LiNbO3波导  光损伤
收稿时间:1993-05-15

STUDY OF PHOTO DAMAGE OF WAVEGUIDE SUBSTRATE OF DOPED LiNbO3 BY m-LINE METHOD
Xu Shiwen,Li Minghua,Gao Yuankai,Xu Yuheng,Yuan Yin,Wan Lide. STUDY OF PHOTO DAMAGE OF WAVEGUIDE SUBSTRATE OF DOPED LiNbO3 BY m-LINE METHOD[J]. Acta Photonica Sinica, 1994, 23(2): 179-183
Authors:Xu Shiwen  Li Minghua  Gao Yuankai  Xu Yuheng  Yuan Yin  Wan Lide
Affiliation:1. Department of Space Engineering, Harbin Institute of Technology, 150006;2. Department of Applied Physics, Harbin Institute of Technology, 150006
Abstract:Photo damage of doped LiNbO3 waveguide was investigated by m-line mothed.It is found that the damage resistance is ordered as Mg:LiNbO3.LiNbOs、Fe:LiNbO3(oxidize)Fe:LiNbO3(reduced).of one kind of material,damage resistance of waveguideby photon exchange is larger than that of Ti-diffuse.
Keywords:m-line method  Doped LiNbO3 waveguide  Photo damage
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