| ADP晶体压电性能的动态测量 |
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| 引用本文： | 黄肇明,庄培其,姜祖涛,于桂芳. ADP晶体压电性能的动态测量[J]. 物理学报, 1966, 22(8): 911-918 |
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| 作者姓名： | 黄肇明 庄培其 姜祖涛 于桂芳 |
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| 作者单位： | 中国科学院;中国科学院;中国科学院;中国科学院 |
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| 摘 要： | 本文在比较了前人测量ADP晶体压电性能的若干重要方法之后,根据ADP晶体的特点,指出采用动态电容方法并增大串接电容CT和修正静电电容C0,这样虽然使用较差的设备,仍得到了较好的结果。
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| 收稿时间： | 1965-07-07 |
A METHOD OF DYNAMIC MEASUREMENT OF THE PIEZOELECTRIC PROPERTY OF ADP CRYSTAL |
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| HUANG ZHAO-MING,ZHUANG PEI-GI,JIANG ZU-TAO and YU GUI-FANG. A METHOD OF DYNAMIC MEASUREMENT OF THE PIEZOELECTRIC PROPERTY OF ADP CRYSTAL[J]. Acta Physica Sinica, 1966, 22(8): 911-918 |
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| Authors: | HUANG ZHAO-MING ZHUANG PEI-GI JIANG ZU-TAO YU GUI-FANG |
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| Abstract: | In this paper, a method of measuring the piezoelectric properties of ADP crystal by introducing a dynamic capacitance as well as increasing the capacitance CT in series with the vibrator and correcting the static capacitance C0 is described. The results of measurement are satisfactory. |
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