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SRAM型FPGA中SEM IP核的验证与自动注错方法
引用本文:张皓,裴玉奎.SRAM型FPGA中SEM IP核的验证与自动注错方法[J].半导体技术,2017,42(3):223-228,240.
作者姓名:张皓  裴玉奎
作者单位:清华大学电子工程系,北京,100084;清华大学宇航中心,北京,100084
基金项目:国家自然科学基金资助项目
摘    要:星载设备长时间工作在空间环境中,宇宙中的带电粒子会造成器件功能异常,产生存储器软错误,严重时会损坏硬件电路.为模拟辐照环境对器件的影响,利用Xilinx公司的软错误缓解(SEM)控制器IP核,搭建了基于Xilinx Kintex-7的验证与测试平台,完成对SEM IP核的功能验证.为提高测试效率,设计了基于上述平台的自动注错方法.经过验证,该方法能够达到预期的帧地址覆盖率.实验结果表明,SEM IP核具备软错误注入与缓解功能,自动注错方法有利于此IP核的实际应用.

关 键 词:单粒子翻转(SEU)效应  静态随机存储器(SRAM)  现场可编程门阵列(FPGA)  软错误缓解(SEM)控制器IP核  自动注错

Verification and Automatic Error Injection Method of SEM IP Core for SRAM-Based FPGAs
Zhang Hao,Pei Yukui.Verification and Automatic Error Injection Method of SEM IP Core for SRAM-Based FPGAs[J].Semiconductor Technology,2017,42(3):223-228,240.
Authors:Zhang Hao  Pei Yukui
Abstract:The satellite equipment works in the space environment permanently.The charged particles radiation in the universe can cause undesired effects in devices,such as soft error in memory devices and even permanent damage in hardware circuits.To simulate the effect of the ionizing radiation on devices,a platform was set up based on the soft error mitigation (SEM) controller IP core on Xilinx Kintex-7 and a functional verification of the SEM IP on the platform was performed.An automatic error injection method was proved by the result of a test,was proposed to improve the efficiency of the verification.After verification,the proposed method can achieve the expected frame address coverage rate.The experimental results show that the SEM IP core has functions of soft error injection and mitigation,and the automatic error injection method contributes to the application of the IP core.
Keywords:single event upset (SEU) effect  static random access memory (SRAM)  field programmable gate array (FPGA)  soft error mitigation (SEM) controller IP core  automatic error injection
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