Magnetic properties of amorphous sputtered CoxSi1−x films

Magnetic properties have been measured by transverse magneto-optic Kerr effect (MOKE) in amorphous sputtered Co_xSi_1?x films which are ferromagnetic and amorphous at room temperature with 0.55<x<0.80. These as-sputtered films show an in-plane easy axis with the ratio of coercitive force in the hard axis H_c (HA) to easy axis H_c (EA) and the value of the blocking field H_B almost constant with 0.60<x<0.80. Transverse magnetic susceptibilities with bias magnetic field parallel (χ_t0) and perpendicular $\text{(χ}{}_{\mathrm{<mtext>t\pi </mtext><mtext>2</mtext>}}\text{)}$ to the easy axis has been measured. These measurements show a deviation of Hoffmann's micromagnetic law for the susceptibilities.