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Spectroscopic Characterization of Dental Ceramics Composed of Yttrium-Stabilized Zirconium
Authors:Marius Rada  Jing Zhang  Wu Zhongua  Mioara Zagrai  Lidia Magerusan
Affiliation:1. CETATEA Department, National Institute for Research &2. Development of Isotopic and Molecular Technologies, Cluj-Napoca, Romania;3. Institute of High Energy Physics, Beijing Synchrotron Radiation Facilities, Beijing Electron Positron Collider National Laboratory, Beijing, People’s Republic of China;4. Department of Physics &5. Chemistry, Technical University, Cluj-Napoca, Romania;6. Department of Physics &
Abstract:Yttria–zirconia ceramics in various compositions of Y2O3 and SiO2 were synthesized by a high temperature solid state reaction process in alumina crucibles at 1400°C for 2?h. The obtained samples were characterized by X-ray diffraction, infrared spectroscopy and X-ray absorption near edge structure analysis. Combining all of the structural characterizations, we conclude that the addition of lower Y2O3 and SiO2 contents induces structural changes in the host matrix without partially or/and fully stabilizing the lattice of the zirconia crystalline phase.
Keywords:Infrared spectroscopy  X ray absorption near edge structure analysis (XANES)  X-ray diffraction  zirconia ceramics
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